Compressed Skewed-Load Delay Test Generation Based on Evolution and Deterministic Initialization of Populations
Keywords:Genetic algorithms, automatic test pattern generation, test data compression, test length, transition delay fault, skewed-load
AbstractThe current design and manufacturing semiconductor technologies require to test the products against delay related defects. However, complex acpSOC require low-overhead testability methods to keep the test cost at an acceptable level. Skewed-load tests seem to be the appropriate way to test delay faults in these acpSOC because the test application requires only one storage element per scan cell. Compressed skewed-load test generator based on genetic algorithm is proposed for wrapper-based logic cores of acpSOC. Deterministic population initialization is used to ensure the highest achievable aclTDF coverage for the given wrapper and scan cell order. The developed method performs test data compression by generating test vectors containing already overlapped test vector pairs. The experimental results show high fault coverages, decreased test lengths and better scalability in comparison to recent methods.
Download data is not yet available.
How to Cite
Dobai, R., & Baláž, M. (2013). Compressed Skewed-Load Delay Test Generation Based on Evolution and Deterministic Initialization of Populations. COMPUTING AND INFORMATICS, 32(2), 251–272. Retrieved from http://www.cai.sk/ojs/index.php/cai/article/view/1620